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International Workshop On X-Ray And Neutron Phase Imaging With Gratings: Tokyo, Japan ; 5-7 March 2012

ISBN: 0735410720, 9780735410725
Author/Editor(s): International Workshop on X-ray and Neutron Phase Imaging with Gratings (2012); Atsushi Momose (1962-); Wataru Yashiro; Japan
Publisher: American Institute Of Physics ( Melville, N.Y. )
Published/Copyright Year: 2012
Language: English
Series: AIP Conference Proceedings ( Volume 1466 )
AIP Conference Proceedings (Online) ( v. 1466 )
Categories:
Phase Contrast Magnetic Resonance Imaging > Congresses
X-ray Microscopy > Congresses
Diagnostic Imaging > Congresses
Imaging Systems > Congresses

Historical Technology, Materials And Conservation: SEM And Microanalysis

ISBN: 1904982654, 9781904982654
Author/Editor(s): Nigel Meeks; British Museum
Publisher: Archetype Publications, In Association With The British Museum ( London )
Published/Copyright Year: 2012
Language: English
Number of pages: 212
Categories:
Scanning Electron Microscopy In Archaeology > Congresses
X-ray Microanalysis > Congresses
Archaeology > Methodology > Congresses
Antiquities > Collection And Preservation > Congresses
Art Objects > Conservation And Restoration > Congresses

X-ray Optics And Microanalysis: Proceedings Of The 21st International Congress, Campinas, Brazil, 5-9 September 2011

ISBN: 0735410275, 9780735410275
Author/Editor(s): International Congress on X-ray Optics and Microanalysis (2011); Carlos A Perez; Angelo Malachias de Souza
Publisher: American Institute Of Physics ( Melville, N.Y. )
Published/Copyright Year: 2012
Language: English
Series: AIP Conference Proceedings ( Volume 1437 )
AIP Conference Proceedings (Online) ( v. 1437 )
Categories:
X-ray Optics > Congresses
Materials > Microscopy > Congresses
X-ray Microanalysis > Congresses
X-ray Microscopes > Congresses

The 10th International Conference On X-ray Microscopy, Chicago, Illinois, USA, 15-20 August 2010

ISBN: 0735409250, 9780735409255
Author/Editor(s): International Conference on X-Ray Microscopy (2010); Ian McNulty; Catherine E Eyberger; Barry Lai
Publisher: American Institute Of Physics ( Mellville, N.Y )
Published/Copyright Year: 2011
Language: English
LCCN: 2011906036
Series: AIP Conference Proceedings ( Volume 1365 )
Number of pages: 473
Categories:
X-ray Microscopy > Congresses

X-Ray Diffraction Crystallography: Introduction, Examples And Solved Problems

ISBN: 3642166342, 9783642166341
Author/Editor(s): Yoshio Waseda; Eiichiro Matsubara; Kozo Shinoda
Publisher: Springer ( New York )
Published/Copyright Year: 2011
Language: English
Number of pages: 310
Categories:
X-ray Crystallography
Crystallography
Engineering
Surfaces (Physics)
Materials Science
Characterization And Evaluation Of Materials
Nanotechnology And Microengineering

X-ray Optics And Microanalysis: Proceedings Of The 20th International Congress, Karlsruhe, Germany, 15-18 September 2009

ISBN: 0735407649, 9780735407640
Author/Editor(s): International Congress on X-ray Optics and Microanalysis (2009); Melissa A Denecke; Clive T Walker
Publisher: American Institute Of Physics ( Melville, N.Y. )
Published/Copyright Year: 2010
Language: English
LCCN: 2011499270
Series: AIP Conference Proceedings ( Volume 1221 )
Number of pages: 214
Categories:
X-ray Optics > Congresses
Materials > Microscopy > Congresses
X-ray Microanalysis > Congresses
X-ray Microscopes > Congresses

Handbook Of Sample Preparation For Scanning Electron Microscopy And X-ray Microanalysis

ISBN: 0387857311, 9780387857312
Author/Editor(s): Patrick Echlin
Publisher: Springer ( New York, NY )
Published/Copyright Year: 2009
Language: English
Number of pages: 330
Categories:
Scanning Electron Microscopy
X-ray Microanalysis
(DE-588)4151898-6 > Elektronenstrahlmikroanalyse > Gnd
(DE-588)4048455-5 > Rasterelektronenmikroskopie > Gnd