X-ray Optics And Microanalysis: Proceedings Of The 21st International Congress, Campinas, Brazil, 5-9 September 2011

ISBN: 0735410275, 9780735410275
Author/Editor(s): International Congress on X-ray Optics and Microanalysis (2011); Carlos A Perez; Angelo Malachias de Souza
Publisher: American Institute Of Physics ( Melville, N.Y. )
Published/Copyright Year: 2012
Language: English
Series: AIP Conference Proceedings ( Volume 1437 )
AIP Conference Proceedings (Online) ( v. 1437 )
Categories:
X-ray Optics > Congresses
Materials > Microscopy > Congresses
X-ray Microanalysis > Congresses
X-ray Microscopes > Congresses

Historical Technology, Materials And Conservation: SEM And Microanalysis

ISBN: 1904982654, 9781904982654
Author/Editor(s): Nigel Meeks; British Museum
Publisher: Archetype Publications, In Association With The British Museum ( London )
Published/Copyright Year: 2012
Language: English
Number of pages: 212
Categories:
Scanning Electron Microscopy In Archaeology > Congresses
X-ray Microanalysis > Congresses
Archaeology > Methodology > Congresses
Antiquities > Collection And Preservation > Congresses
Art Objects > Conservation And Restoration > Congresses

X-ray Optics And Microanalysis: Proceedings Of The 20th International Congress, Karlsruhe, Germany, 15-18 September 2009

ISBN: 0735407649, 9780735407640
Author/Editor(s): International Congress on X-ray Optics and Microanalysis (2009); Melissa A Denecke; Clive T Walker
Publisher: American Institute Of Physics ( Melville, N.Y. )
Published/Copyright Year: 2010
Language: English
LCCN: 2011499270
Series: AIP Conference Proceedings ( Volume 1221 )
Number of pages: 214
Categories:
X-ray Optics > Congresses
Materials > Microscopy > Congresses
X-ray Microanalysis > Congresses
X-ray Microscopes > Congresses

Handbook Of Sample Preparation For Scanning Electron Microscopy And X-ray Microanalysis

ISBN: 0387857311, 9780387857312
Author/Editor(s): Patrick Echlin
Publisher: Springer ( New York, NY )
Published/Copyright Year: 2009
Language: English
Number of pages: 330
Categories:
Scanning Electron Microscopy
X-ray Microanalysis
(DE-588)4151898-6 > Elektronenstrahlmikroanalyse > Gnd
(DE-588)4048455-5 > Rasterelektronenmikroskopie > Gnd