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X-ray Powder Diffraction Patterns Of Clays And Clay Minerals In Botswana

ISBN: 9991294996, 9789991294995
Author/Editor(s): Georges-lvo E Ekosse
Publisher: X-Ray Diffraction Unit, University Of Botswana ( Gaborone, Botswana )
Published/Copyright Year: 2005
Language: English
LCCN: 2005327705
Number of pages: 78
Categories:
Clay Minerals > Botswana
X-ray Crystallography > Botswana
Clay > Analysis
X-rays > Diffraction

Fundamentals Of Powder Diffraction And Structural Characterization Of Materials

ISBN: 0387241477, 9780387241470
Author/Editor(s): Vitalij K Pecharsky; Peter Y Zavalij
Publisher: Springer ( New York )
Published/Copyright Year: 2005
Language: English
LCCN: 2005042474
Number of pages: 713
Categories:
X-rays > Diffraction > Measurement
Powders > Optical Properties > Measurement
X-ray Crystallography

Rayons X Et Matiere: RX 2003 Strasbourg, France, 9-11 Decembre 2003

ISBN: 286883759X, 9782868837592
Author/Editor(s): RX 2003 ((2003); A Cornet; P Denier; N Broll; Ecole nationale superieure des arts et industries de Strasbourg
Publisher: EDP Sciences ( Les Ulis Codex A, France )
Published/Copyright Year: 2004
Language: French
Series: Journal De Physique ( v. 118 )
Number of pages: 463
Categories:
X-rays > Congresses
X-rays > Diffraction > Congresses
X-ray Spectroscopy > Congresses

Three-dimensional X-ray Diffraction Microscopy: Mapping Polycrystals And Their Dynamics

ISBN: 3540223304, 9783540223306
Author/Editor(s): Henning Friis Poulsen
Publisher: Springer ( New York )
Published/Copyright Year: 2004
Language: English
LCCN: 2004109594
Series: Springer Tracts In Modern Physics ( v. 205 )
Number of pages: 154
Categories:
X-ray Microscopy
X-rays > Diffraction
Magnetic Resonance Microscopy

Fundamentals Of Powder Diffraction And Structural Characterization Of Materials

ISBN: 1402073658, 9781402073656
Author/Editor(s): Vitalij K Pecharsky; Peter Y Zavalij
Publisher: Kluwer Academic Publishers ( Boston )
Published/Copyright Year: 2003
Language: English
LCCN: 2003050112
Number of pages: 713
Categories:
X-rays > Diffraction > Measurement
Powders > Optical Properties > Measurement
X-ray Crystallography

Rayons X Et Matiere: RX 2001 Colloque Dedie A La Memoire D'Andre Guinier ENSAIS, Ecole Nationale Superieure Des Arts Et Industries, Strasbourg, France, 4-7 Decembre 2001

ISBN: 2868836143, 9782868836144
Author/Editor(s): RX 2001 ((2001); A Cornet; N Broll; P Denier; Ecole nationale superieure des arts et industries de Strasbourg
Publisher: EDP Sciences ( Les Ulis Codex A, France )
Published/Copyright Year: 2002
Language: French
LCCN: 2003402433
Series: Journal De Physique ( v. 12, Pr6 )
Number of pages: 537
Categories:
X-rays > Congresses
X-rays > Diffraction > Congresses
X-ray Spectroscopy > Congresses